EOSC 521 - Microbeam and Diffraction Methods for the Characterization of Minerals and Materials
Course Description
Theory and practice of qualitative and quantitative microanalysis of bulk specimens and particles for chemical composition, texture and crystal structure using the scanning electron microscope, electron-probe microanalyzer and X-ray powder diffractometer with the Rietveld method. Emphasis is on the interpretation and application of the results to solving problems in Earth and Materials Sciences. Students completing this course will be qualified to use this equipment at the Dept. of Earth & Ocean Sciences.
UBC Calendar
For a full listing of course offerings please see the UBC
calendar description
Learning Goals
under development
Instructors
Mati Raudsepp
Textbook
Reed, S.J.B. (2005): Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, Cambridge (2nd Ed.).
Course Content
Download Material
Lecture Topics
| Week | Topic |
|---|
| 1 | Introduction, Sample preparation |
| 2 | Electron-target interactions and X-ray production, Electron-optical column |
| 3 | Qualititative X-ray analysis, Scanning Electron Microscopy |
| 4 | Scanning Electron Microscopy, Element Mapping |
| 5 | Nature of X-rays and diffraction from crystals |
| 6 | Qualitative phase analysis using powder diffractometry |
| 7 | Quantitative phase analysis using the Rietveld method |
| 8 | Quantitative phase analysis using the Rietveld method |
| 9 | X-ray spectrometers, quantitative X-ray analysis |
| 10 | Quantitative X-ray analysis |
| 11 | Accuracy of X-ray analysis and treatment of results |
| 12 | Project tutorials |
Labs
TBA